AOI

Automated Optical Inspection

AOI

Automated Optical Inspection

Delivers superior defect detection performance with automated optical solutions optimized for a wide range of industrial applications

GigaVis's Automated Optical Inspection (AOI) solution
provides unrivaled technological capabilities for the
precise inspection of microscopic defects in patterns and
holes in semiconductor substrates and next-generation technology applications.

Watch Demo Video

Main

Package Substrate

  • FC-BGA
  • FC-CSP

PCB & Materials

  • MLB
  • HDI
  • FPCB
  • CCL

Expansion

  • Glass Mask
  • Thin Flim Power Inductor

Advance

Semiconductor Mid-end

  • PLP
  • FC-WLP

PCB & Materials

  • Glass Substrate

InSmart Nano

Product Introduction

InSmart Nano 2/2

InSmart Nano 2/2 — Dimension, Weight, Panel Size, Line/Space specifications
ITEM SPECIFICATIONS
Dimension 1,460 (W) * 2,660 (D) * 2300 (H) mm
Weight 4,100 Kg, Possible to change due to option
Panel Size Standard Max: 510 * 515 mm
Line / Space Above 2 / 2㎛
InSmart Nano 2/2 Product Image

Defect Image Acquisition

  • MONO

    MONO Defect Image
  • COLOR

    COLOR Defect Image
  • UV

    UV Defect Image

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